The Microelectronics Engineering and Technology (MET) department is seeking candidates for a position as a Senior / Principal Electrical Engineer with experience with semiconductor devicereliability to be part of a team to develop next generation microwave and millimeter wave GaN and GaAs semiconductor devices and circuits. The MET department designs and manufactures compound semiconductor devices, millimeter/microwave integrated circuits (MMICs) and modules for defense and commercial applications and is a part of Raytheon Electrical Engineering Directorate (EDD).
In this role, the successful candidate will employ the following skills:
Knowledge:Familiar with the area of device Reliability; have the ingenuity and resourcefulness to be able to develop advanced technologies and concepts.
Discretion:Act independently and as part of a team to uncover and resolve issues.
Vision: Support the development of METs strategic semiconductor reliability roadmaps, innovative measurements systems, and new characterization techniques.
Impact:Provide the innovation and maturation of new technologies and concepts resulting in new product/business opportunities for Raytheon.
Liaison:Report to program management and key spokesperson on reliably issues.
This position can be a Salary Grade E04 or Salary Grade E05 based on the candidate’s qualifications as they relate to the skills, experience and responsibility requirements for the position.
Required Education and Experience:
BSEE or device physics plus minimum of 6 years of experience OR MSEE or device physics plus minimum of 4 years of experience.
Experience with RF and DC reliability measurements and /or stress testing on semiconductor GaN and GaAS devices.
Experience with either Arrhenius, or FIT or MTTF data analysis
Experience with Failure Mode Effect Analysis (FMEA) techniques
PhD in electrical engineering or device physics
Capability to facilitate standard reliability tasks
Ability to perform and advance device, circuit, and module reliability measurements
Willingness to interact and support teams of device and circuit designers, device modeling engineers, failure analysis experts and test engineers
Experience with on-wafer reliability testing techniques and device characterization
Ability to obtain a security clearance
Experience with identifying and understanding device failure mechanisms
Experience using different types of die attach and carriers and knowledgeable on their effects on device reliability
Experience with various failure analysis techniques including but not limited to electrical tests, visual inspections, Scanning Electron Microscope (SEM), Transmission Electron Microscope (TEM), Focused Ion Beam (FIB)
Statistical and data analysis background
KEYWORDS: Reliability, RF, Microwave, Millimeter-wave, microelectronics, Senior Electrical Engineer, device physics84047